Atomic force microscope based biomolecular force-clamp measurements using a micromachined electrostatic actuator
نویسندگان
چکیده
منابع مشابه
Atomic force microscope based biomolecular force-clamp measurements using a micromachined electrostatic actuator.
The authors describe a method for biomolecular force clamp measurements using atomic force microscope (AFM) cantilevers and micromachined membrane-based electrostatic actuators. The actuators comprise of Parylene membranes with embedded side actuation electrodes and are fabricated on a silicon substrate. The devices have a displacement range of 1.8 μm with 200 V actuation voltage, and displacem...
متن کاملUncertainty quantification in nanomechanical measurements using the atomic force microscope.
Quantifying uncertainty in measured properties of nanomaterials is a prerequisite for the manufacture of reliable nanoengineered materials and products. Yet, rigorous uncertainty quantification (UQ) is rarely applied for material property measurements with the atomic force microscope (AFM), a widely used instrument that can measure properties at nanometer scale resolution of both inorganic and ...
متن کاملForce Spectroscopy with the Atomic Force Microscope
Introduction and Review Atomic Force Microscope (AFM) Spectroscopy is an AFM based technique to measure, and sometimes control the polarity and strength of the interaction between the AFM tip and the sample. Although the tip-sample interaction may be studied in terms of the energy, the quantity that is measured first is always the tip-sample force, and thus the nomenclature: force spectroscopy....
متن کاملForce-feedback High-speed Atomic Force Microscope
High-speed atomic force microscopy (HSAFM) has enabled researchers to view the nanometer-scale dynamic behavior of individual biological and bio-relevant molecules at a molecular-level resolution under physiologically relevant time scales, which is the realization of a dream in life sciences. These high-speed imaging applications now extend to the cellular/bacterial systems with the use of a sm...
متن کاملScanned-cantilever atomic force microscope
We have developed a 3.6 pm scan range atomic force microscope that scans the cantilever instead of the sample, while the optical-lever detection apparatus remains stationary. The design permits simpler, more adaptable sample mounting, and generally improves ease of use. Software workarounds alleviate the minor effects of spurious signal variations that arise as a result of scanning the cantilev...
متن کاملذخیره در منابع من
با ذخیره ی این منبع در منابع من، دسترسی به آن را برای استفاده های بعدی آسان تر کنید
ژورنال
عنوان ژورنال: Ultramicroscopy
سال: 2012
ISSN: 0304-3991
DOI: 10.1016/j.ultramic.2012.07.023